Inel CPS-120 X-Ray Diffractometer

Our Inel CPS-120 x-ray powder diffractometer has a large-angle position-sensitive detector, seen to the right in the figure as a brown arc with a red nameplate. X-ray diffraction patterns are acquired at all angles simultaneously, instead of stepping over 1024 points in two-theta angle, for example. Data acquisition is typically 200 times faster than with our stepping diffractometers, although there can be signal-to-noise problems when the sample emits strong fluorescence radiation under the primary beam. The electronics for the PSD (matched amplifiers, pulse shapers, digital delay unit, time-amplitude converter, multichannel analyzer, and computer interface buffer) are at the left of the figure.

Return to Lab Facilities page