Inel CPS-120 X-Ray Diffractometer
Our Inel CPS-120 x-ray powder diffractometer has a large-angle
position-sensitive detector, seen to the right in the figure as a brown arc
with a red nameplate. X-ray diffraction patterns are acquired
at all angles simultaneously, instead of stepping over 1024 points
in two-theta angle, for example. Data acquisition is typically
200 times faster than with our stepping diffractometers, although
there can be signal-to-noise problems when the sample emits
strong fluorescence radiation under the primary beam.
The electronics for the PSD (matched amplifiers, pulse shapers,
digital delay unit, time-amplitude converter, multichannel analyzer, and computer
interface buffer) are at the left of the figure.
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